B.A.Sc., M.A.Sc., Ph.D. (Toronto), P.Eng.
Professor, Dept. of Chemical Engineering and Applied Chemistry, University of Toronto
Phone: (416) 978-7406
Fax: (416) 978-8605
Electrochemistry and Corrosion, Environmental Engineering, interfacial surface property relationships.
Technical advice on electrochemical systems. Forensic analysis of corrosion failures.
Donald W. Kirk is a Professor of the Department of Chemical Engineering and Applied Chemistry at the University of Toronto and is a Director of the Pacific Basin Consortium for Hazardous Waste located at the East-West Center Hawaii. He obtained his B.A.Sc. (Engineering Science), and M.A.Sc. and Phd (1979,Chemical Engineering) degrees in the Faculty of Applied Science and Engineering at the University of Toronto, specializing in materials and electrochemistry.
Professor Kirk is interested in interfacial reactions and the influence of surface properties particularly in interaction with aqueous systems. These interactions are able to be manipulated using electrochemical techniques and through modification of surface structures.. The interfacial reactions manifest themselves through the degradation of materials by their interaction with the environment and through the rates of reaction via catalytic action. Professor Kirk holds 15 patents in the subject area ranging from production of catalytic amorphous alloys, volatilization of heavy metals from industrial dusts, sulphur dioxide leaching and to electrochemical cell technology (electrolysis, fuel cells and electroplating). The research conducted is a mixture of experimental and theoretical approaches focusing on industrial problems. He has published extensively in refereed journals, and has many conference presentations and other scholarly addresses.
Professor Kirk provides advice on electrochemistry and corrosion. This includes forensic failure analysis of metals and components in support of insurance claims and litigation. He can provide specialized testing and analysis services including chemical analysis, thermal analysis and detailed surface characterization based on light, SEM and EDX microscopy. Professor Kirk is also available to provide advice on SR&ED tax claims, and on patents related to his fields of expertise.
Complete CV available upon request.